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Number of items: 10.
Engineering and Physical Sciences Research Council (EPSRC)
Bryant, Angus T., Yang, Shaoyong, Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li, Tavner, Peter and Palmer, Patrick R. (2011) Investigation into IGBT dV/dt during turn-off and its temperature dependence. IEEE Transactions on Power Electronics, Volume 26 (Number 10). pp. 3019-3031. doi:10.1109/TPEL.2011.2125803 ISSN 0885-8993.
Yang, Shaoyong, Bryant, Angus T., Mawby, P. A., Xiang, Dawei, Ran, Li and Tavner, Peter J. (2011) An industry-based survey of reliability in power electronic converters. IEEE Transactions on Industry Applications, Vol.47 (No.3). pp. 1441-1451. doi:10.1109/TIA.2011.2124436 ISSN 0093-9994.
Yang, Shaoyong, Xiang, Dawei, Bryant, Angus T., Mawby, P. A., Ran, Li and Tavner, Peter J. (2010) Condition monitoring for device reliability in power electronic converters : a review. IEEE Transactions on Power Electronics, Volume 25 (Number 11). pp. 2734-2752. doi:10.1109/TPEL.2010.2049377 ISSN 0885-8993.
Toyota Jidōsha Kabushiki Kaisha
Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.) (2008) Fast thermal models for power device packaging. In: IEEE Industry-Applications-Society Annual Meeting, Alberta, Canada, Oct 05-09, 2008. Published in: Industry Applications Society. IEEE - IAS Annual Meeting. Conference Record, Vol.1-5 pp. 1457-1464. ISBN 978-1-4244-2278-4. doi:10.1109/08IAS.2008.359 ISSN 0197-2618.
U.S. Office of Naval Research
Lu, Liqing, Chen, Zhiyang, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico (2010) Modeling of MOS-Side carrier injection in trench-gate IGBTs. IEEE Transactions on Industry Applications, Vol.46 (No.2). pp. 875-883. doi:10.1109/TIA.2009.2039770 ISSN 0093-9994.
United States. Office of Naval Research
Bryant, Angus T., Lu, Liqing, Santi, Enrico, Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I : Device model. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 189-197. doi:10.1109/TPEL.2007.911823 ISSN 0885-8993.
Lu, Liqing, Bryant, Angus T., Santi, E. (Enrico), Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part II : Parameter extraction. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 198-205. doi:10.1109/TPEL.2007.911825 ISSN 0885-8993.
University of Cambridge. Schiff Foundation
Bryant, Angus T., Yang, Shaoyong, Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li, Tavner, Peter and Palmer, Patrick R. (2011) Investigation into IGBT dV/dt during turn-off and its temperature dependence. IEEE Transactions on Power Electronics, Volume 26 (Number 10). pp. 3019-3031. doi:10.1109/TPEL.2011.2125803 ISSN 0885-8993.
Bryant, Angus T., Lu, Liqing, Santi, Enrico, Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I : Device model. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 189-197. doi:10.1109/TPEL.2007.911823 ISSN 0885-8993.
Lu, Liqing, Bryant, Angus T., Santi, E. (Enrico), Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part II : Parameter extraction. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 198-205. doi:10.1109/TPEL.2007.911825 ISSN 0885-8993.
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